The defect structure and the critical current density of a highly textured YBa2Cu3O7 thin film
S. Senoussi, K. Frikach, C. ColliexVolume:
235-240
Year:
1994
Language:
english
Pages:
2
DOI:
10.1016/0921-4534(94)92604-2
File:
PDF, 201 KB
english, 1994