Development Pattern Recognition Model for the Classification of Circuit Probe Wafer Maps on Semiconductors
Chang, Cheng-Wei, Chao, Tsung-Ming, Horng, Jorng-Tzong, Lu, Chien-Feng, Yeh, Rong-HweiVolume:
2
Language:
english
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology
DOI:
10.1109/tcpmt.2012.2215327
Date:
December, 2012
File:
PDF, 2.43 MB
english, 2012