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Electromigration induced dynamics of surface dislocations and atomic steps
Shimoni, N., Biham, O., Millo, O.Volume:
17
Year:
1999
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.581874
File:
PDF, 719 KB
english, 1999