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Hot-electron and thermal effects on the dynamic characteristics of single-transit SiC impact-ionization avalanche transit-time diodes
Joshi, R. P., Pathak, S., Mcadoo, J. A.Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.359982
File:
PDF, 1.03 MB
english, 1995