Garbage collection policy to improve durability for flash...

IEEE Transactions on Consumer Electronics 2012 / 11 Vol. 58; Iss. 4

Garbage collection policy to improve durability for flash memory

Xu, Guangxia, Liu, Yanbing, Zhang, Xiaoqin, Lin, Mingwei
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Volume:
58
Language:
english
Journal:
IEEE Transactions on Consumer Electronics
DOI:
10.1109/tce.2012.6414990
Date:
November, 2012
File:
PDF, 218 KB
english, 2012
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