[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - Alpha emission of fully processed silicon wafers
Wong, Richard, Wen, Shi-Jie, Su, Peng, Dwyer-McNally, BrendanYear:
2010
Language:
english
DOI:
10.1109/iirw.2010.5706481
File:
PDF, 222 KB
english, 2010