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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Transistor Performance Scaling: The Role of Virtual Source Velocity and Its Mobility Dependence
Khakifirooz, Ali, Antoniadis, Dimitri A.Year:
2006
Language:
english
DOI:
10.1109/iedm.2006.346873
File:
PDF, 368 KB
english, 2006