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Current-voltage measurements as a probe of the activation barriers for flux creep in thin films of YBa2Cu3O7−δ
P. Berghuis, R. Herzog, R.E. Somekh, J.E. Evetts, R.A. Doyle, F. Baudenbacher, A.M. CampbellVolume:
256
Year:
1996
Language:
english
Pages:
20
DOI:
10.1016/0921-4534(95)00632-x
File:
PDF, 1.60 MB
english, 1996