[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Tozeur, Tunisia (2008.03.25-2008.03.27)] 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - RF transceiver parameter identification using regressive models
Khereddine, Rafik, Simeu, Emmanuel, Mir, SalvadorYear:
2008
Language:
english
DOI:
10.1109/dtis.2008.4540208
File:
PDF, 288 KB
english, 2008