Corrected direct force balance method for atomic force...

Corrected direct force balance method for atomic force microscopy lateral force calibration

Asay, David B., Hsiao, Erik, Kim, Seong H.
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Volume:
80
Year:
2009
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3142243
File:
PDF, 627 KB
english, 2009
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