![](/img/cover-not-exists.png)
Effect of structural and morphological imperfections on the microwave surface resistance of YBCO thin films
A.G. Zaitsev, R. Wördenweber, T. Königs, E.K. Hollmann, S.V. Rasumov, O.G. VendikVolume:
264
Year:
1996
Language:
english
Pages:
8
DOI:
10.1016/0921-4534(96)00201-8
File:
PDF, 515 KB
english, 1996