Determining optical properties of thin films by modified...

Determining optical properties of thin films by modified attenuated total reflection with a charge coupled device

Wilson, P. W.
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Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575560
Date:
July, 1988
File:
PDF, 544 KB
english, 1988
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