Analysis of temperature-dependent barrier heights in...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2008 Vol. 26; Iss. 1

Analysis of temperature-dependent barrier heights in erbium-silicided Schottky diodes

Jun, Myungsim, Jang, Moongyu, Kim, Yarkeon, Choi, Cheljong, Kim, Taeyoub, Oh, Soonyoung, Lee, Seongjae
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Volume:
26
Year:
2008
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.2825172
File:
PDF, 395 KB
english, 2008
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