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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Fault models and test methods for subthreshold SRAMs
Lin, Chen-Wei, Chen, Hung-Hsin, Yang, Hao-Yu, Chao, Mango C.-T., Huang, Rei-FuYear:
2010
Language:
english
DOI:
10.1109/test.2010.5699245
File:
PDF, 443 KB
english, 2010