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[IEEE 2009 IEEE 59th Electronic Components and Technology Conference (ECTC 2009) - San Diego, CA, USA (2009.05.26-2009.05.29)] 2009 59th Electronic Components and Technology Conference - The effects of SAC alloy composition on aging resistance and reliability
Zhang, Yifei, Cai, Zijie, Suhling, Jeffrey C., Lall, Pradeep, Bozack, Michael J.Year:
2009
Language:
english
DOI:
10.1109/ectc.2009.5074043
File:
PDF, 2.85 MB
english, 2009