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A new method for measuring thermal conductivity of thin films
Govorkov, S., Ruderman, W., Horn, M. W., Goodman, R. B., Rothschild, M.Volume:
68
Year:
1997
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1148035
File:
PDF, 384 KB
english, 1997