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Quantitative impedance measurement using atomic force...

Quantitative impedance measurement using atomic force microscopy

O’Hayre, Ryan, Feng, Gang, Nix, William D., Prinz, Fritz B.
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Volume:
96
Year:
2004
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1778217
File:
PDF, 515 KB
english, 2004
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