[IEEE 2014 27th IEEE International System-on-Chip Conference (SOCC) - Las Vegas, NV, USA (2014.9.2-2014.9.5)] 2014 27th IEEE International System-on-Chip Conference (SOCC) - Comparative study of FinFETs versus 22nm bulk CMOS technologies: SRAM design perspective
Farkhani, Hooman, Peiravi, Ali, Kargaard, Jens Madsen, Moradi, FarshadYear:
2014
Language:
english
DOI:
10.1109/socc.2014.6948971
File:
PDF, 1.48 MB
english, 2014