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Study of Supercapacitor Aging and Lifetime Estimation According to Voltage, Temperature, and RMS Current
Kreczanik, Paul, Venet, Pascal, Hijazi, Alaa, Clerc, GuyVolume:
61
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/tie.2013.2293695
Date:
September, 2014
File:
PDF, 974 KB
english, 2014