X-ray diffraction and EXAFS studies of sputter-deposited...

X-ray diffraction and EXAFS studies of sputter-deposited TiPd films

M Yamada, H Tsunoda, K Tanaka, K Sumiyama
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Volume:
134
Year:
1991
Language:
english
Pages:
4
DOI:
10.1016/0921-5093(91)90904-2
File:
PDF, 244 KB
english, 1991
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