![](/img/cover-not-exists.png)
[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Fully integrated active magnetic probe for high-definition near-field measurement
Aoyama, S., Kawahito, S., Yamaguchi, M.Year:
2006
Language:
english
DOI:
10.1109/isemc.2006.1706340
File:
PDF, 624 KB
english, 2006