Modeling and parameter extraction of test fixtures for...

International Journal of RF and Microwave Computer-Aided Engineering 2013 / 10 Vol. 23; Iss. 6

Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz

Álvarez-Botero, Germán, Torres-Torres, Reydezel, Murphy-Arteaga, Roberto S.
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Volume:
23
Language:
english
Journal:
International Journal of RF and Microwave Computer-Aided Engineering
DOI:
10.1002/mmce.20701
Date:
October, 2013
File:
PDF, 622 KB
english, 2013
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