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[IEEE 24th International Reliability Physics Symposium - Anaheim, CA, USA (1986.04.1-1986.04.3)] 24th International Reliability Physics Symposium - ESD Protection Reliability in 1μM CMOS Technologies
Duvvury, C., McPhee, R.A., Baglee, D.A., Rountree, R.N.Year:
1986
Language:
english
DOI:
10.1109/irps.1986.362134
File:
PDF, 8.25 MB
english, 1986