[IEEE 2010 Annual IEEE India Conference (INDICON) - Kolkata, India (2010.12.17-2010.12.19)] 2010 Annual IEEE India Conference (INDICON) - Hamming distance based distributed scan chain reordering for test power optimization
Mehta, Usha Sandeep, Dasgupta, Kankar S., Devashrayee, Niranjan M., Choksi, KushalYear:
2010
Language:
english
DOI:
10.1109/indcon.2010.5712749
File:
PDF, 286 KB
english, 2010