X-ray photoelectron spectroscopy and Auger spectroscopy...

X-ray photoelectron spectroscopy and Auger spectroscopy studies of thin silicon nitride films thermally grown on silicon

Sobolewski, M. A.
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Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575702
Date:
May, 1988
File:
PDF, 686 KB
english, 1988
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