Making a commercial atomic force microscope more accurate...

Making a commercial atomic force microscope more accurate and faster using positive position feedback control

Mahmood, I. A., Moheimani, S. O. Reza
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Volume:
80
Year:
2009
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3155790
File:
PDF, 973 KB
english, 2009
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