![](/img/cover-not-exists.png)
Making a commercial atomic force microscope more accurate and faster using positive position feedback control
Mahmood, I. A., Moheimani, S. O. RezaVolume:
80
Year:
2009
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3155790
File:
PDF, 973 KB
english, 2009