X-ray spectral power measurements utilizing the diffraction pattern of a slit
Baker, K. L., Porter, J. L., Ruggles, L. E., Chrien, R. E., Idzorek, G. C.Volume:
70
Year:
1999
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1149642
File:
PDF, 341 KB
english, 1999