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[IEEE International Conference on Computer Aided Design (ICCAD) - San Jose, CA, USA (5-9 Nov. 2000)] IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) - A parametric test method for analog components in integrated mixed-signal circuits
Pronath, M., Gloeckel, V., Graeb, H.Year:
2000
Language:
english
DOI:
10.1109/iccad.2000.896531
File:
PDF, 632 KB
english, 2000