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[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Proposed universal relationship between dielectric breakdown and dielectric constant
McPherson, J., Kim, J., Shanware, A., Mogul, H., Rodriguez, J.Year:
2002
Language:
english
DOI:
10.1109/iedm.2002.1175919
File:
PDF, 243 KB
english, 2002