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[IEEE 2012 Joint 21st IEEE ISAF / 11th IEEE ECAPD / IEEE PFM (ISAF/ECAPD/PFM) - Aveiro, Portugal (2012.07.9-2012.07.13)] Proceedings of ISAF-ECAPD-PFM 2012 - Effect of oxygen pressure on the structural, electrical properties of Bi0.90La0.10Fe0.95Mn0.05O3 thin films and characterization for memory applications
Kolte, Jayant, Daryapurkar, Aatish, Apte, Prakash, Gopalan, PrakashYear:
2012
Language:
english
DOI:
10.1109/isaf.2012.6297800
File:
PDF, 633 KB
english, 2012