[IEEE 2012 Joint 21st IEEE ISAF / 11th IEEE ECAPD / IEEE PFM (ISAF/ECAPD/PFM) - Aveiro, Portugal (2012.07.9-2012.07.13)] Proceedings of ISAF-ECAPD-PFM 2012 - Effect of oxygen pressure on the structural, electrical properties of Bi0.90La0.10Fe0.95Mn0.05O3 thin films and characterization for memory applications

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