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The electrical characterization of grain boundaries in ultra-fine grained Y-TZP
C.S. Chen, M.M.R. Boutz, B.A. Boukamp, A.J.A. Winnubst, K.J. de Vries, A.J. BurggraafVolume:
168
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0921-5093(93)90732-t
File:
PDF, 340 KB
english, 1993