Approach to enhance deuterium incorporation for improved...

Applied Physics Letters 2000 Vol. 77; Iss. 15

Approach to enhance deuterium incorporation for improved hot carrier reliability in metal-oxide-semiconductor devices

Cheng, Kangguo, Lee, Jinju, Lyding, Joseph W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
77
Year:
2000
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1317546
File:
PDF, 369 KB
english, 2000
Conversion to is in progress
Conversion to is failed