[IEEE 2006 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2006.10.16-2006.09.19)] 2006 IEEE International Integrated Reliability Workshop Final Report - Burn-In Acceleration Considerations in 90nm System LSI
Wakai, Nobuyuki, Kobira, Yuji, Oishi, Tamotsu, Yamasaki, Shinichi, Egawa, HidemitsuYear:
2006
Language:
english
DOI:
10.1109/irws.2006.305238
File:
PDF, 573 KB
english, 2006