[IEEE IC's (ISPSD) - San Diego, CA, USA (2011.05.23-2011.05.26)] 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs - Relaxation of current filament due to RFC technology and ballast resistor for robust FWD operation
Nishii, Akito, Nakamura, Katsumi, Masuoka, Fumihito, Terashima, TomohideYear:
2011
Language:
english
DOI:
10.1109/ispsd.2011.5890799
File:
PDF, 720 KB
english, 2011