Investigating minority-carrier lifetime in small spherical...

Investigating minority-carrier lifetime in small spherical Si using microwave photoconductance decay

Liu, Zhengxin, Masuda, Atsushi, Kondo, Michio
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Volume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2936979
File:
PDF, 668 KB
english, 2008
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