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Evaluation of stresses in NiNiO and CrCr2O3 during high temperature oxidation by in situ X-ray diffraction
John G. Goedjen, James H. Stout, Qiti Guob, David A. ShoresVolume:
177
Year:
1994
Language:
english
Pages:
10
DOI:
10.1016/0921-5093(94)90483-9
File:
PDF, 1003 KB
english, 1994