Degradation of bipolar transistors under high current...

Degradation of bipolar transistors under high current stress at 300 K

Wachnik, R. A., Bucelot, T. J., Li, G. P.
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Volume:
63
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.340131
File:
PDF, 1006 KB
english, 1988
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