Effect of the impact ionization of deep traps on the field...

Journal of Applied Physics 2001 Vol. 89; Iss. 1

Effect of the impact ionization of deep traps on the field distribution in planar thin-film GaAs structures

Prokhorov, Eugenio F., González-Hernández, Jesus, Gorev, Nikolai B., Kodzhespirova, Inna F., Kovalenko, Yury A.
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Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1325004
File:
PDF, 325 KB
english, 2001
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