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Reflection second-harmonic microscopy of individual semiconductor microstructures
Bozhevolnyi, Sergey I., Maidykovski, Anton, Vohnsen, Brian, Zwiller, ValéryVolume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1415536
File:
PDF, 1.08 MB
english, 2001