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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Error Rate Reduction in DNA Self-Assembly by Non-Constant Monomer Concentrations and Profiling
Jang, B., Kim, Y-B., Lombardi, F.Year:
2007
Language:
english
DOI:
10.1109/date.2007.364398
File:
PDF, 297 KB
english, 2007