Cost of ownership model for inspection of multiple quality...

IEEE Transactions on Semiconductor Manufacturing 2003 / 08 Vol. 16; Iss. 3

Cost of ownership model for inspection of multiple quality attributes

So Young Sohn,, Hyoung Uk Moon,
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Volume:
16
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2003.815897
Date:
August, 2003
File:
PDF, 891 KB
english, 2003
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