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[IEEE ICMTS 93 1993 International Conference on Microelectronic Test Structures - Sitges, Spain (22-25 March 1993)] ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures - Junction evaluation by time dependent degradation due to high constant voltage stressing (DRAMs)
Mitsuhashi, J., Komori, J., Eimori, T., Koyama, H.Year:
1992
Language:
english
DOI:
10.1109/icmts.1993.292883
File:
PDF, 253 KB
english, 1992