Determining concentration depth profiles of thin foam films...

Review of Scientific Instruments 2010 Vol. 81; Iss. 11

Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy

Ridings, Christiaan, Andersson, Gunther G.
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Volume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3491736
File:
PDF, 665 KB
english, 2010
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