![](/img/cover-not-exists.png)
[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - High Threshold Voltage Matching Performance on Gate-All-Around MOSFET
Cathignol, Augustin, Cros, Antoine, Harrison, Samuel, Cerrutti, Robin, Coronel, Philippe, Pouydebasque, Arnaud, Rochereau, Krysten, Skotnicki, Thomas, Ghibaudo, GerardYear:
2006
Language:
english
DOI:
10.1109/essder.2006.307717
File:
PDF, 388 KB
english, 2006