Double- to single-hump shape change of secondary electron emission curve for thermal SiO[sub 2] layers
Yu, SeGi, Jeong, Taewon, Yi, Whikun, Lee, Jeonghee, Jin, Sunghwan, Heo, Jungna, Kimb, J. M., Jeon, D.Volume:
79
Year:
2001
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1419046
File:
PDF, 304 KB
english, 2001