MeV heavy ion induced recrystallization of buried silicon nitride layer: Role of energy loss processes
Som, T., Sinha, O. P., Ghatak, J., Satpati, B., Kanjilal, D.Volume:
101
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2435071
File:
PDF, 398 KB
english, 2007