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[IEEE 2014 IEEE AUTOTEST - St. Louis, MO, USA (2014.9.15-2014.9.18)] 2014 IEEE AUTOTEST - A testability growth model and its application
Zhao, Chenxu, Qiu, Jing, Liu, Guanjun, Lv, Kehong, Pattipati, KrishinaYear:
2014
Language:
english
DOI:
10.1109/autest.2014.6935132
File:
PDF, 935 KB
english, 2014