[IEEE 2009 International Semiconductor Device Research Symposium (ISDRS 2009) - College Park, MD (2009.12.9-2009.12.11)] 2009 International Semiconductor Device Research Symposium - Analysis of oxide bulk trapped charge distribution and densities from photo injection characteristics of oxide-nitride-oxide (ONO) structures
Woong Lee,, Dae-Han Yoo,, Eun-Young Lee,, Jinkwon Bok,, Youngwoo Hyung,, Younghan Roh,Year:
2009
Language:
english
DOI:
10.1109/isdrs.2009.5378319
File:
PDF, 169 KB
english, 2009