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The measurement of the trace Li content and distribution in ZnO films and the thickness of these films
Wen, Liang-Bi, Huang, Yan-Wen, Li, Shang-BaiVolume:
62
Year:
1987
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.339487
File:
PDF, 422 KB
english, 1987