Investigations on PdIn-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry
T. Pirling, K. Fricke, M. Schüβler, W.Y. Lee, H. Fueβ, H.L. HartnagelVolume:
29
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0921-5107(94)04032-y
File:
PDF, 368 KB
english, 1995